In House Test Facility

JEI’s in-house test facility enables customers to test RF/Microwave applications as well as Analog/Digital, Hi Pot, In-Circuit and Functional Test, and DFT. JEI’s test facility stands out from the competition. Test Manager David Perry has been in the industry for over 40 years and his experience enables customers to develop a complete solution. Dave has a working background in RF/Microwave applications. The lab can accommodate frequency ranges from DC to 26 GHz and even higher with additional equipment. JEI’s computer automated test software aids in our final test and analysis. The automated test except for ICT is typically supplied by our customers. Standard tests performed at JEI would be conversion gain, image rejection and noise figure versus frequency. In testing an IF amp they would adjust output power, verify AGC functions and measure return loss and flatness. In testing oscillators, typical tests would be to verify RF output level and frequency accuracy, phase noise and return loss. With over a $1m investment in test equipment, the customer has multiple choices for test, including the option of customer consigned equipment which truly utilizes JEI as an extension of the customer.

In-House Test Capabilities

• Design for Testability (DFT)
• In-Circuit Test
• MDA/Hi-Pot Test
• Functional Test
• Full RF/Microwave Test Capability
• GPS Capability
• Vacuum or Overclamp Fixture Design
• Lab view Software used

 

Automatic Test Equipment

In-Circuit Tester…………………	Teradyne 2286 (TS86)
MDA w/ Hi-Pot
Tester…………………………………	Cirrus 1500V-Touch 1

 

R.F. MICROWAVE TEST EQUIPMENT

Spectrum Analyzer …………...……………..	Agilent 8563EC
Scalar Nework Analyzer……………………..	Hewlett Packard 8756A
Spectrum Analyzer Opt 6, 7, 8……………..	Hewlett Packard 8563E
Network Analyzer…………………………….	Hewlett Packard 8751A
Network Analyzer……………………………..	Hewlett Packard 3577A
S-Parameter Test Set………………………..	Hewlett Packard 87511B
S-Parameter Test Set………………………..	Hewlett Packard 35677B
Sweep Oscillator……………………………..	Hewlett Packard 8350B (Quantity 2)
RF Plug In……………………………………..	Hewlett Packard 83592B (Quantity 2)
Analyzer Transmitter…………………………	Anritsu ME538L
Analyzer Receiver…….………………………	Anritsu ME538L
Directional Bridge…………………………….	Hewlett Packard 85027B
AC Detector……………………………………	Hewlett Packard 11664A
Noise Figure Meter……………………………	Hewlett Packard 8970A
Noise Source………………………………….	Hewlett Packard 346B
Frequency Counter……………………………	Hewlett Packard 5343A
Plotter………………………………………….	Hewlett Packard 7440A
Power Meter…………………………………..	Hewlett Packard EMP-441
Power Meter…………………………………..	Hewlett Packard 436A
Power Meter…………………………………..	Hewlett Packard 435A
Signal Generator………………………………	Hewlett Packard 8657B
AC/DC Detector……………………………….	Hewlett Packard 82025B
Power Sensor…………………………………	Hewlett Packard 8485A (Quantity 2)
Mod-Demod……………………………………	Hewlett Packard 3717A
Signal Generator………………………………	Tektronix 1910
Waveform Monitor…………………………….	Tektronix 1780R

 

Computer Automated Testing

Labview Analog & Digital…………………….

National Instruments

 

General Test Equipment

Hi-Pot Tester………………………………….	Associated Research, Inc. AR5014A
	General Radio
Impedance Bridge…………………………….	10400
Impedance Bridge…………………………….	Electro-Scientific Auto LRC 296 (Quantity 2)
Chip Programmer……………………………..	Data I/O 2900
Oscilloscopes	Various Manufacturers
Meters	Various Manufacturers
DVM's	Various Manufacturers